Special Issue:
"Piezoelectric Sensors for Determination of Analytes in Solutions" -
Sensors Journal
Guest EditorProf. Dr. W. KutnerProfessor of Chemistry Institute of Physical Chemistry
Polish Academy of Sciences Kasprzaka 44/52 01-224 Warsaw, Poland
Tel. +48 22 343 32 17; Fax +48 22 343 33 33
E-mail: wkutner@ichf.edu.PL;
http://malina.ichf.edu.pl/person/kutner_w.htmlNew Deadline for Paper Submission: 30 June 2008
Keywordselectrochemical
quartz crystal microbalance (EQCM), piezoelectric chemical sensor,
piezoelectric electrochemical sensor, piezosensor, piezoelectric quartz
crystal sensor, piezoelectric immunosensor, shear- wave acoustic
sensor, thickness-shear-mode acoustic wave sensor, surface acoustic
wave (SAW) sensor, quartz resonator, selective surface film or coating,
piezoelectric microgravimetry, microweighing, quality factor, resonance
frequency, film visco-elasticity, dynamic resistance, ion dynamics at
the film-solution interface, solid-phase microextraction,
interdigitaded (ITD) electronic surface film, continuous electronic
surface film, bulk acoustic wave (BAW) sensors, AT-cut quartz crystal,
BT-cut quartz, crystal, ST-cut quartz crystal, SC-cut quartz crystal.
Published Papers
Antonio Arnau
Departamento
de Ingeniería Electrónica, Universidad Politécnica de Valencia, Camino
de Vera s/n, Valencia 46022, Spain.
E-mail: aarnau@eln.upv.es
Received: 28 December 2007 / Accepted: 16 January 2008 / Published: 21 January 2008
Review: A Review of Interface Electronic Systems for AT Cut Quartz Crystal Microbalance Applications in Solutions
Figure 1. (a).avi; Figure 1. (b).avi - p. 372
Sensors 2008, 8, 370-411 (PDF format, 980 K)
Planned PapersTitle:
"Design of EQCN Sensors for the Detection of Low Concentration Levels of Heavy Metal Toxicants" Authors: Maria Hepel and Julia Dallas
The
State University of New York at Potsdam, Department of Chemistry,
Stowell Hall, 44 Pierrepont Ave., Potsdam , NY 13676, U.S.A.
Tel. +1 315 267 2267, Fax +1 315 267 3170
E-mail: hepelmr@potsdam.edu
Submission
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http://www.mdpi.org/sensorsMDPI - Matthias Burkhalter - 4 April 2008